About Me

My Engineering Background

I am Bailun (Alex) Wu, an Electrical Test Engineer with a UCLA EE background. I am open to opportunities across electrical engineering domains, with hands-on experience in analog circuit design, hardware reliability, firmware validation, and DSP-informed analysis.

I focus on turning complex product behavior into clear test evidence, so teams can ship with confidence and faster debug loops.

Journey

How I Grew Across Engineering Work

Foundation

UCLA Electrical Engineering

Built core depth in circuits, systems, control, and signal analysis through academic and project work.

Application

Hands-On Test Engineering

Moved from classroom theory to production-oriented validation using fixtures, test procedures, and root-cause analysis.

Current

Optical + Firmware + Data

At CIG, I evaluate optical transceivers, collaborate with firmware teams, and use data to speed troubleshooting.

Work Approach

Core Focus and Working Style

Core Focus

Analog circuit design and signal validation
Optical transceiver evaluation and failure analysis
Firmware testing with data-driven troubleshooting

Working Style

Define testable plans from ambiguous requirements
Collaborate tightly with hardware and firmware teams
Document results for fast team handoff

Proof of Impact

Selected Metrics

60%

Micromouse speed improvement while preserving control precision.

18.3s

Path-following run time on a 3.4-meter PID track.

Test domains: gas/flame detection and optical transceiver evaluation.

Capabilities

What I Bring to a Team

Optical Transceiver Evaluation Analog Circuit Design Test Case Execution Firmware Unit Testing Failure Analysis Calibration and Verification Signal and Frequency Analysis Python, MATLAB, C/C++ Cross-Functional Debug Collaboration Technical Documentation

Contact

Connect With Me

If my profile fits your team, I would be happy to connect and share more details.

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